[Tech] R: Problemi disco?
Lorenzo
loren.b@tin.it
Lun 25 Ott 2010 17:29:55 CEST
Ciao, grazie per la risposta,
in effetti ho provato me così a occhio sembra che non ci siano errori ecco
l'output:
stanotte proverò ad effettuare un test long (non l'ho mai fatto ma magari
esce qualcosa di nuovo)
Device Model: Hitachi HDS721010CLA332
Serial Number: JP2930HQ1XXP8P
Firmware Version: JP4OA39C
User Capacity: 1,000,204,886,016 bytes
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 4
Local Time is: Mon Oct 25 17:24:54 2010 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x84) Offline data collection activity
was suspended by an interrupting
command from host.
Auto Offline Data Collection:
Enabled.
Self-test execution status: ( 0) The previous self-test routine
completed
without error or no self-test has
ever
been run.
Total time to complete Offline
data collection: (10282) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off
support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 171) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED
WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 091 091 016 Pre-fail Always
- 131120
2 Throughput_Performance 0x0005 136 136 054 Pre-fail Offline
- 95
3 Spin_Up_Time 0x0007 253 253 024 Pre-fail Always
- 95 (Average 96)
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always
- 139
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always
- 0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always
- 0
8 Seek_Time_Performance 0x0005 132 132 020 Pre-fail Offline
- 34
9 Power_On_Hours 0x0012 100 100 000 Old_age Always
- 4512
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always
- 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always
- 139
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always
- 145
193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always
- 145
194 Temperature_Celsius 0x0002 153 153 000 Old_age Always
- 39 (Lifetime Min/Max 18/66)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always
- 0
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always
- 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline
- 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always
- 0
SMART Error Log Version: 0
No Errors Logged
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours)
LBA_of_first_error
# 1 Short offline Completed without error 00% 4462
-
# 2 Short offline Completed without error 00% 4462
-
# 3 Short offline Completed without error 00% 3776
-
# 4 Short offline Completed without error 00% 2767
-
# 5 Short offline Completed without error 00% 1497
-
# 6 Short offline Completed without error 00% 901
-
# 7 Short offline Completed without error 00% 901
-
# 8 Short offline Completed without error 00% 901
-
# 9 Short offline Completed without error 00% 901
-
#10 Short offline Completed without error 00% 901
-
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
-----Messaggio originale-----
Da: tech-bounces@firenze.linux.it [mailto:tech-bounces@firenze.linux.it] Per
conto di Carlo Baffa
Inviato: sabato 23 ottobre 2010 23.17
A: Discussioni tecniche
Oggetto: Re: [Tech] Problemi disco?
On Sat, 23 Oct 2010, Lorenzo wrote:
>
> Ma vedendo l'output (di seguito) non sembra che ci siano errori
>
> smartctl -l selftest /dev/sda
>
Devi provarea dare
smartctl -a /dev/sda
Cosi' ti da' tutti i diagnostici.
Carlo
----
Carlo Baffa INAF - Osservatorio Astrofisico di Arcetri
baffa@arcetri.astro.it Largo Fermi 5 I-50125-Firenze ITALY
http://www.arcetri.astro.it/baffa Fax (+39) 055 5609713
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