[ImoLUG] Formattazione basso livello
Stefano Ballardini
stefano.ballardini@gmail.com
Lun 13 Maggio 2013 13:00:21 CEST
Ecco qua un po' di smartmontools, non ci capisco una mazza, ma voi si perņ
:-D
pippersss
root@debsrv:/home/stefano# smartctl --all /dev/sdb
smartctl 5.41 2011-06-09 r3365 [x86_64-linux-3.2.0-4-amd64] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Caviar Blue Serial ATA
Device Model: WDC WD800AAJS-60PSA0
Serial Number: WD-WCAP93773566
LU WWN Device Id: 5 0014ee 1ab2b438c
Firmware Version: 21.12M22
User Capacity: 80,026,361,856 bytes [80,0 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 7
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Mon May 13 13:05:18 2013 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART STATUS RETURN: incomplete response, ATA output registers missing
SMART overall-health self-assessment test result: PASSED
Warning: This result is based on an Attribute check.
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine
completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 2160) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 32) minutes.
SCT capabilities: (0x103f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED
WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 200 200 051 Pre-fail
Always - 178
3 Spin_Up_Time 0x0003 160 157 021 Pre-fail
Always - 2966
4 Start_Stop_Count 0x0032 097 097 000 Old_age
Always - 3917
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail
Always - 0
7 Seek_Error_Rate 0x000f 200 200 051 Pre-fail
Always - 0
9 Power_On_Hours 0x0032 086 086 000 Old_age
Always - 10889
10 Spin_Retry_Count 0x0013 100 100 051 Pre-fail
Always - 0
11 Calibration_Retry_Count 0x0013 100 100 051 Pre-fail
Always - 0
12 Power_Cycle_Count 0x0032 097 097 000 Old_age
Always - 3779
187 Reported_Uncorrect 0x0032 100 001 000 Old_age
Always - 161
188 Command_Timeout 0x0032 001 001 000 Old_age
Always - 21475164588
190 Airflow_Temperature_Cel 0x0022 079 049 040 Old_age
Always - 21
192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age
Always - 265
193 Load_Cycle_Count 0x0032 199 199 000 Old_age
Always - 3940
194 Temperature_Celsius 0x0022 122 092 000 Old_age
Always - 21
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age
Always - 0
197 Current_Pending_Sector 0x0012 200 200 000 Old_age
Always - 0
198 Offline_Uncorrectable 0x0010 200 200 000 Old_age
Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age
Always - 421
200 Multi_Zone_Error_Rate 0x0008 200 068 051 Old_age
Offline - 0
SMART Error Log Version: 1
ATA Error Count: 165 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 165 occurred at disk power-on lifetime: 10878 hours (453 days + 6
hours)
When the command that caused the error occurred, the device was active or
idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 f0 e0 96 01 e0 Error: IDNF 240 sectors at LBA = 0x000196e0 = 104160
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
35 00 f0 e0 96 01 00 00 06:03:59.742 WRITE DMA EXT
35 00 f0 f0 95 01 00 00 06:03:59.738 WRITE DMA EXT
35 00 f0 f0 95 01 00 00 06:03:28.833 WRITE DMA EXT
35 00 f0 00 95 01 00 00 06:03:28.828 WRITE DMA EXT
35 00 f0 10 94 01 00 00 06:03:28.812 WRITE DMA EXT
Error 164 occurred at disk power-on lifetime: 10878 hours (453 days + 6
hours)
When the command that caused the error occurred, the device was active or
idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 f0 70 61 01 e0 Error: IDNF 240 sectors at LBA = 0x00016170 = 90480
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
35 00 f0 70 61 01 00 00 05:40:15.194 WRITE DMA EXT
35 00 f0 70 61 01 00 00 05:39:44.255 WRITE DMA EXT
35 00 f0 80 60 01 00 00 05:39:44.251 WRITE DMA EXT
35 00 f0 80 60 01 00 00 05:39:13.320 WRITE DMA EXT
35 00 f0 90 5f 01 00 00 05:39:13.316 WRITE DMA EXT
Error 163 occurred at disk power-on lifetime: 10877 hours (453 days + 5
hours)
When the command that caused the error occurred, the device was active or
idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 f0 00 c3 00 e0 Error: IDNF 240 sectors at LBA = 0x0000c300 = 49920
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
35 00 f0 00 c3 00 00 00 04:41:55.914 WRITE DMA EXT
35 00 f0 00 c3 00 00 00 04:41:24.979 WRITE DMA EXT
35 00 f0 10 c2 00 00 00 04:41:24.975 WRITE DMA EXT
35 00 f0 20 c1 00 00 00 04:41:24.971 WRITE DMA EXT
35 00 f0 20 c1 00 00 00 04:40:54.027 WRITE DMA EXT
Error 162 occurred at disk power-on lifetime: 10876 hours (453 days + 4
hours)
When the command that caused the error occurred, the device was active or
idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 f0 60 90 00 e0 Error: IDNF 240 sectors at LBA = 0x00009060 = 36960
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
35 00 f0 60 90 00 00 00 04:23:21.059 WRITE DMA EXT
35 00 f0 60 90 00 00 00 04:22:50.124 WRITE DMA EXT
35 00 f0 70 8f 00 00 00 04:22:50.119 WRITE DMA EXT
35 00 f0 80 8e 00 00 00 04:22:50.115 WRITE DMA EXT
35 00 f0 80 8e 00 00 00 04:22:19.176 WRITE DMA EXT
Error 161 occurred at disk power-on lifetime: 4534 hours (188 days + 22
hours)
When the command that caused the error occurred, the device was active or
idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 60 24 5e e0 Error: UNC at LBA = 0x005e2460 = 6169696
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 5f 24 5e 00 00 00:06:52.488 READ DMA
c8 00 01 00 00 00 00 00 00:06:52.488 READ DMA
c8 00 08 5f 24 5e 00 00 00:06:50.424 READ DMA
c8 00 01 00 00 00 00 00 00:06:50.424 READ DMA
c8 00 08 67 24 5e 00 00 00:06:50.424 READ DMA
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Il giorno 13 maggio 2013 08:14, Stefano Ballardini <
stefano.ballardini@gmail.com> ha scritto:
> Intanto grazie a tutti,
> stasera provo a postate i risultati di smartmontools e provo a recuperare
> i tool di westerndigital per il formattone basso livello... ma con calma,
> oggi e' la giornata mondiale della lenteeeezzzzaaa a a :-D :-D
>
> pi pper sss
>
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